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Single event upset
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11	(C)2005 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution t Add to Reading List Source URL: institutes.lanl.gov Language: English - Date: 2007-02-23 15:00:41 Digital electronics Nuclear physics Data quality Soft error Particle physics Neutron Spallation Static random-access memory Single event upset Physics Computer memory Nuclear technology
12	Mitigating Single Event Upsets Add to Reading List Source URL: www.altera.com Language: English - Date: 2014-06-19 13:37:54 Computer memory Single event upset Field-programmable gate array Soft error Altera Error detection and correction Semiconductor intellectual property core Cyclic redundancy check LEON Electronic engineering Digital electronics Electronics
13	Name of research institute or organization: Add to Reading List Source URL: www.ifjungo.ch Language: English - Date: 2014-03-27 09:52:31 Electronic engineering International nongovernmental organizations Standards organizations Computer memory Data quality Soft error Single event upset Transient Cosmic ray Digital electronics Engineering Physics
14	Microsoft Word - 124_SPAESRANE_2_f.doc Add to Reading List Source URL: www.ifjungo.ch Language: English - Date: 2014-03-27 09:52:38 Radiation Radioactivity Radiobiology Particle physics Ionizing radiation Neutron Radioactive decay Single event upset Physics Astroparticle physics Cosmic ray
15	TEMPORALLY REDUNDANT LATCH FOR PREVENTING SINGLE EVENT DISRUPTIONS IN SEQUENTIAL INTEGRATED CIRCUITS Dr. David G. Mavis Paul H. Eaton Add to Reading List Source URL: klabs.org Language: English - Date: 2009-01-19 23:25:20 Electromagnetism Computer memory Integrated circuits Logic families Single event upset Flip-flop Radiation hardening Dynamic voltage scaling CMOS Electronic engineering Electronics Digital electronics
16	RH1020 SINGLE EVENT CLOCK UPSET SUMMARY REPORT Prepared: March 5, 1998 Prepared By: Add to Reading List Source URL: klabs.org Language: English - Date: 2009-01-17 09:35:20 Electromagnetism Clock signal Computer memory Logic gates Flip-flop Single event upset Clock Counter Pulse generator Digital electronics Electronic engineering Electronics
17	Source of Acquisition NASA Johnson Space Center The Ionizing Radiation Environmenton the International Space Station: o ~ Avionics a nce vs. E x p e c ~ t i for Add to Reading List Source URL: www.iss-casis.org Language: English - Date: 2014-02-23 13:22:45 Human spaceflight Radiobiology Space science Manned spacecraft Health threat from cosmic rays Radiation protection Single event upset Radiation hardening Ionizing radiation Spaceflight Physics Space
18	QUANTIFICATION OF PHENOMENA OBSERVED DURING A SINGLE EVENT UPSET TEST ON A RECOVERABLE FLIGHT CONTROL COMPUTER Matthew A. Ferguson, Undergraduate Student, Old Dominion University, Norfolk, VA Advisor: Linda Vahala, Ph.D. Add to Reading List Source URL: vsgc.odu.edu Language: English - Date: 2007-09-17 12:12:48 Neutron Particle physics Exotic matter Radiation hardening Spallation Neutron scattering Soft error S-process Neutrino Physics Nuclear physics Nuclear technology
19	Single Event Upsets in Aircraft Avionics 6 In 2001, the NASA Altair, Unmanned Air Vehicle (UAV) flew its first flight at an altitude of 100,000 feet. Add to Reading List Source URL: www.nasa.gov Language: English - Date: 2013-04-30 20:26:13 Neutron Single event upset Imaging Digital electronics Physics Baryons
20	Proceedings of the Int'l Safeguards Workshop: Design and Testi Add to Reading List Source URL: www.bnl.gov Language: English - Date: 2011-09-06 08:42:29 Engineering International Atomic Energy Agency Nuclear proliferation Reliability engineering Radiation hardening Single event upset Soft error Ionizing radiation Instrumentation Technology Digital electronics Electronic engineering

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